1. 中国电力科学研究院有限公司,北京,100192
2. 国家电网有限公司,北京,100031
收稿:2026-05-15,
纸质出版:2026
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杨洋, 高飞, 尚文同, 等. 基于改进扩散模型的小样本变电缺陷图像生成方法[J]. 高电压技术, 2026,52(7):3040-3051.
YANG Yang, GAO Fei, SHANG Wentong, et al. 基于改进扩散模型的小样本变电缺陷图像生成方法[J]. 2026, 52(7): 3040-3051.
杨洋, 高飞, 尚文同, 等. 基于改进扩散模型的小样本变电缺陷图像生成方法[J]. 高电压技术, 2026,52(7):3040-3051. DOI: 10.13336/j.1003-6520.hve.20251837.
YANG Yang, GAO Fei, SHANG Wentong, et al. 基于改进扩散模型的小样本变电缺陷图像生成方法[J]. 2026, 52(7): 3040-3051. DOI: 10.13336/j.1003-6520.hve.20251837.
由于膨胀器冲顶等变电缺陷危急程度高、发生频次低,缺陷图像样本少,亟需通过图像生成方式扩充小样本缺陷图像,支撑变电缺陷图像识别算法有效提升。该文提出了基于改进扩散模型的变电缺陷图像小样本生成方法。首先,针对小样本训练生成式模型难以控制缺陷真实性的问题,提出了改进生成扩散模型,通过添加ResNext轻量控制分支,实现对多样性缺陷细节的精准生成。然后,针对生成大图时背景失真的问题,降低模型学习难度和大图生成运算内存资源,提出通过缺陷掩膜区域生成,并将缺陷区域融合至原始图像。最后针对缺少缺陷图像生成质量评价方法,综合了图像质量指标,即弗雷彻初始距离(Frechet inception distance
FID)、初始分数(inception score
IS)、结构相似性指数(structural similarity index measure
SSIM)、视觉信息保真度(visual information fidelity
VIF))和目标检测模型提升指标F1分数(F1-Score,F1)综合评价生成的缺陷图像质量。试验表明,该文方法相对于GAN和SD系列生成式算法,在小样本变电缺陷图像生成图像质量指标上提高了25%;相比于仅用真实缺陷和正常样本训练的目标检测算法,采用该文方法添加使用正常图像和本文生成的缺陷图像后,训练的目标检测算法的F1分数平均提升12%以上。
Due to the high severity and low frequency of substation defects in expander topping and the small number of defect image samples
it is urgent to expand the small-sample defect images through image generation methods to support the effective improvement of substation defect image recognition algorithms. This paper proposes a small sample generation method for transformer defect images based on the improved diffusion model. Firstly
aiming at the problem that the generative model trained with small samples is difficult to control the authenticity of defects
an improved generative diffusion model is proposed. By adding the ResNext lightweight control branch
the precise generation of diverse defect details is achieved. Then
aiming at the problem of background distortion when generating large images and reducing the learning difficulty of the model and the video memory resources for generating large images
this paper proposes to generate through defect mask regions and fuse the defect regions into the original image. Finally
in view of the lack of a quality evaluation method for defect image generation
this paper comprehensively evaluates the quality of the generated defect images by integrating image quality indicators
including Frechet inception distance (FID)
inception score (IS)
structural similarity index measure (SSIM)
visual information fidelity(VIF)
and the improvement index of the target detection model (including F1 score). Experiments show that
compared with the GAN and SD series generative algorithms
the method proposed in this paper can be adopted to improve the image quality index of small-sample transformer defect image generation by 25%. Compared with the object detection algorithm trained only with real defects and normal samples
after adding normal images and the defect images generated using the method proposed in this paper
the F1 score of the trained object detection algorithm is increased by more than 12% on average.
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